| With technology developing, we will see a significant move from 2D- to 3D-X-Ray inspection, including semiconductor and SMT industry.
Current µ-focus X-Ray systems offer high resolution and advanced detail detectability. However, but it suffer from major limitations in terms of speed and throughput which are important requirements in industrial CT application. Y. QUICK SCAN is new technology which was developed by FEINFOCUS. The capabilities and performance of High-Speed µ-Focus CT can be seen in below chart
| Number of projections |
540 720 1080 |
| Acquisition time (sec.) |
18 24 36 |
| Reconstruction time (sec.) |
84 106 162 |
| Total time (sec.) |
102 130 198 |
|
